BOZ,İbrahimGÖKTAŞ,AbdullahTUMBUL,AhmetKILIÇ,Ahmet2020-07-212020-07-212019978-605-83516-6-0https://hdl.handle.net/20.500.12514/2171Chemically derived polycrystalline ZnS thin films have a profound potantial for the optoelectronic and luminescent devices. Regarding this crucial fact that the chemically grown ZnS thin films, prepared at different Zn and S molar ratios, was investigated by X-ray diffraction (XRD), photoluminescence (PL), Fourier transmission infrared (FT-IR) spectrocopy and UV-Vis spectrocopy. The obtained results showed that the ZnS thin films had a hexagonal crystall structure. The crystalline quality of the films was changed depend on the molar ratios. The FT-IR analysis confirmed the formation of Zn-S binding. The PL measurements verified the presence of the main PL emissions of the ZnS structure. The UV-Vis analysis showed the transmittance and absorbance intensity was changed according to the molar ratios as well as the optical band gap of the ZnS thin filmseninfo:eu-repo/semantics/openAccessChemical route, ZnS, Molar ratio, Photoluminescence, FT-IR, Band gapConference Object111548552